Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. - Juin J. Liou; R. Shireen; Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Antonio Cerdeira; Xiaofang Gao; Xuecheng Zou; Ching-Sung Ho (Microelectron. Reliab., 2002)