Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. - H. V. Nguyen; Cora Salm; R. Wenzel; A. J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

Inductance Extraction for Interconnects in the Presence of Nonlinear Magnetic Materials. - Yang Yi; R. Wenzel; Vivek Sarin; Weiping Shi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)