Internal testing of integrated circuits by noncontact sampling electrostatic force microscopy using pulse width modulation technique. - Ra'a A. Said (ISCAS (1), 1999)

Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. II. Applications, capabilities, and limitations. - Ra'a A. Said (ISCAS, 2000)

Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. I. Principle and demonstration. - Ra'a A. Said (ISCAS, 2000)

Introducing design skills at the freshman level: structured design experience. - Michael L. Jacobson; Ra'a A. Said; Habib-ur Rehman 001 (IEEE Trans. Educ., 2006)

An Integrated Approach for Strategic Development of Engineering Curricula: Focus on Students' Design Skills. - Habib-ur Rehman 001; Ra'a A. Said; Yousef Al-Assaf (IEEE Trans. Educ., 2009)