Reliability prediction of 3C-SiC cantilever beams using dynamic Raman spectroscopy. - Raden Dewanto; Tao Chen; Rebecca Cheung; Zhongxu Hu; Barry J. Gallacher; John Hedley (NEMS, 2012)

Characterization of strain fields in graphene films. - Raden Dewanto; Carl Dale; Zhongxu Hu; Neil Keegan; Barry J. Gallacher; John Hedley (NEMS, 2012)