Reduction of the acquisition time for CMOS time-resolved photon emission by optimized IR detection. - Radu Ispasoiu; Tom Crawford; Brian Johnston; Chris Shaw; Steven Kasapi; Jason Goertz; Olivier Rinaudo; Peter Ouimet (Microelectron. Reliab., 2006)

Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. - Ulrike Kindereit; Christian Boit; Uwe Kerst; Steven Kasapi; Radu Ispasoiu; Roy Ng; William K. Lo (Microelectron. Reliab., 2008)

Method for Quantifying Image Sensor Susceptibility to Chromatic Flare Artifacts. - Orit Skorka; David Jasinski; Radu Ispasoiu; Vladi Korobov (Digital Photography and Mobile Imaging, 2016)

Correlation of Photo-Response Blooming Metrics with Image Quality in CMOS Image Sensors for Mobile Photography. - Pulla Reddy Ailuri; Orit Skorka; Ning Li; Radu Ispasoiu; Vladi Korobov (IQSP, 2016)

Lag-Induced Image Artifacts in Still Imaging with CIS. - Leo Anzagira; Orit Skorka; Pulla Reddy Ailuri; Radu Ispasoiu (IMSE, 2018)

Characterization of Image Sensor Resolution by Single-Pixel Illumination. - Victor Lenchenkov; Orit Skorka; Robert Gravelle; Ulrich Boettiger; Radu Ispasoiu (IMSE, 2018)

Color correction for RGB sensors with dual-band filters for in-cabin imaging applications. - Orit Skorka; Paul J. Kane; Radu Ispasoiu (Autonomous Vehicles and Machines, 2019)