An evaluation of BTI degradation of 32nm standard cells. - Rafael B. Schivittz; Cristina Meinhardt; Paulo F. Butzen (ICECS, 2015)

A probabilistic model for stuck-on faults in combinational logic gates. - Rafael B. Schivittz; Denis Teixeira Franco; Cristina Meinhardt; Paulo F. Butzen (LATS, 2016)

Inserting permanent fault input dependence on PTM to improve robustness evaluation. - Rafael B. Schivittz; Rafael Fritz; Denis Teixeira Franco; Lirida A. B. Naviner; Cristina Meinhardt; Paulo F. Butzen (SBCCI, 2016)

The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits. - Matheus F. Pontes; Paulo F. Butzen; Rafael B. Schvittz; Leomar S. da Rosa Jr.; Denis Teixeira Franco (ICECS, 2018)

Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults. - Rafael B. Schvittz; Denis Teixeira Franco; Leomar S. da Rosa Jr.; Paulo F. Butzen (ICECS, 2018)

Reliability evaluation of circuits designed in multi- and single-stage versions. - Rafael B. Schvittz; Matheus F. Pontes; Cristina Meinhardt; Denis Teixeira Franco; Lirida A. B. Naviner; Leomar S. da Rosa; Paulo F. Butzen (LASCAS, 2018)

Fault masking ratio analysis of majority voters topologies. - Ingrid F. V. Oliveira; Rafael B. Schvittz; Paulo F. Butzen (LATS, 2018)

An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults. - Rafael B. Schvittz; Denis Teixeira Franco; Leomar S. da Rosa; Paulo F. Butzen (VLSI-SoC (Selected Papers), 2019)

A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates. - Rafael B. Schvittz; Denis Teixeira Franco; Leomar Soares; Paulo Francisco Butzen (VLSI-SoC, 2019)

Exploring Logic Gates Layout to Improve the Accuracy of Circuit Reliability Estimation. - Rafael B. Schvittz; Leomar Soares; Paulo Francisco Butzen (VLSI-SoC, 2019)

Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients. - Rafael B. Schvittz; Paulo F. Butzen; Leomar S. da Rosa (ITC, 2020)

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. - Tiago R. Balen; Carlos J. González; Ingrid F. V. Oliveira; Rafael B. Schvittz; Nemitala Added; Eduardo L. A. Macchione; Vitor A. P. de Aguiar; Marcilei Aparecida Guazzelli; Nilberto H. Medina; Paulo F. Butzen (LATS, 2021)

Fault Tolerance Evaluation of Different Majority Voter Designs. - Ingrid F. V. Oliveira; Matheus F. Pontes; Rafael B. Schvittz; Leomar S. da Rosa Jr.; Paulo F. Butzen; Rafael Iankowski Soares (ISCAS, 2022)

The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis. - Matheus F. Pontes; Ingrid F. V. Oliveira; Rafael B. Schvittz; Leomar Soares da Rosa Jr.; Paulo F. Butzen (ISCAS, 2022)

Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. - Clayton R. Farias; Rafael B. Schvittz; Tiago R. Balen; Paulo F. Butzen (LATS, 2022)

Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing. - Rafael N. M. Oliveira; Fábio G. R. G. da Silva; Ricardo Reis 001; Rafael B. Schvittz; Cristina Meinhardt (SBCCI, 2022)

Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. - Bernardo Borges Sandoval; Leonardo Heitich Brendler; Fernanda Lima Kastensmidt; Ricardo Reis 001; Alexandra L. Zimpeck; Rafael B. Schvittz; Cristina Meinhardt (ISCAS, 2023)

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. - Tiago R. Balen; Carlos J. González; Ingrid F. V. Oliveira; Leomar S. da Rosa Jr.; Rafael Iankowski Soares; Rafael B. Schvittz; Nemitala Added; Eduardo L. A. Macchione; Vitor A. P. Aguiar; Marcilei Aparecida Guazzelli; Nilberto H. Medina; Paulo F. Butzen (J. Electron. Test., 2023)

Transistor-Level Logic Gates Ranking Strategy for Selective Hardening. - Glória D. Claro da Silva; Rafael B. Schvittz; Paulo F. Butzen (SBESC, 2024)

Evaluation of Transient Fault Tolerance in Different Logic Styles of 2: 1 Multiplexers. - Ana Flávia Reis; Bernardo Borges Sandoval; Cristina Meinhardt; Adriano V. Werhli; Rafael B. Schvittz (LASCAS, 2025)