Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology. - Rafael N. M. Oliveira; Alan D. Lüdke; Cristina Meinhardt (ICECS, 2019)

Mirror Full Adder SET Susceptibility on 7nm FinFET Technology. - Rafael N. M. Oliveira; Fábio G. R. G. da Silva; Ricardo Reis 001; Cristina Meinhardt (ICECS, 2020)

SET Mitigation Techniques on Mirror Full Adder at 7 nm FinFET Technology. - Rafael N. M. Oliveira; Fábio G. R. G. da Silva; Ricardo Reis 001; Cristina Meinhardt (LATS, 2021)

Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing. - Rafael N. M. Oliveira; Fábio G. R. G. da Silva; Ricardo Reis 001; Rafael B. Schvittz; Cristina Meinhardt (SBCCI, 2022)

Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology. - Fábio G. R. G. da Silva; Rafael N. M. Oliveira; Alexandra L. Zimpeck; Cristina Meinhardt; Ricardo Reis 001 (Integr., 2022)