Study of the impact of electromigration on integrated circuit performance and reliability at design level. - Rafael O. Nunes; R. L. de Orio (Microelectron. Reliab., 2017)

Operational Amplifier Performance Degradation and Time-to-Failure due to Electromigration. - Rafael O. Nunes; R. L. de Orio (SBCCI, 2018)