Designing Testable Control Paths with Multiple and Feedback Scan-Paths. - Rafic Z. Makki; C. Tiansheng (ITC, 1986)

SSC-a tool for the synthesis of testable sequential machines. - Rafic Z. Makki; J. Muha; Silvio Bou-Ghazale; T. Kaylani (Compcon, 1990)

Practical partitioning for testability with time-shared boundary scan. - Rafic Z. Makki; Krisbnm Palaniswami (ITC, 1990)

On the Integration of Design and Manufacturing for Improved Testability. - Rafic Z. Makki; Kasra Daneshvar; Farid Tranjan; Richard Greene (ITC, 1991)

Automatic Test Pattern Generation with Branch Testing. - Rafic Z. Makki; Silvio Bou-Ghazale; Chen Tianshang (IEEE Trans. Computers, 1991)

A testable static RAM structure for efficient coverage of pattern sensitive faults. - Shyang-Tai Su; Rafic Z. Makki (VTS, 1992)

Testing of static random access memories by monitoring dynamic power supply current. - Shyang-Tai Su; Rafic Z. Makki (J. Electron. Test., 1992)

Analysis and Characterization of State Assignment Techniques for Sequential Machines. - Rafic Z. Makki; Shyang-Tai Su (VLSI Design, 1994)

Pioneer: A New Tool for Coding of Multi-Level Finite State Machines Based on Evolution Programming. - Subbu Muddappa; Rafic Z. Makki; Zbigniew Michalewicz; Sridhar Isukapalli (VLSI Design, 1994)

Power supply current detectability of SRAM defects. - Jian Liu; Rafic Z. Makki (Asian Test Symposium, 1995)

Transient Power Supply Current Testing of Digital CMOS Circuits. - Rafic Z. Makki; Shyang-Tai Su; H. Troy Nagle (ITC, 1995)

Transient power supply current monitoring - A new test method for CMOS VLSI circuits. - Shyang-Tai Su; Rafic Z. Makki; H. Troy Nagle (J. Electron. Test., 1995)

Advancements in Power Supply Current Testing. - Rafic Z. Makki (VLSI Design, 1997)

IDDQ Testing Experiments for Various CMOS Logic Design Structures. - Abdulnour Y. Toukmaji; Ronald Helms; Rafic Z. Makki; Wadie Mikhail; Patrick Toole (VLSI Design, 1997)

Dynamic Power Supply Current Testing of SRAMs. - Jian Liu; Rafic Z. Makki; Ayman I. Kayssi (Asian Test Symposium, 1998)

Testing of Embedded Memories - The Aggregate. - Rafic Z. Makki (Asian Test Symposium, 1998)

Dynamic Power Supply Current Testing of CMOS SRAMs. - Jian Liu; Rafic Z. Makki; Ayman I. Kayssi (J. Electron. Test., 2000)

IDDT Testing of Embedded CMOS SRAMs. - Suriya Ashok Kumar; Rafic Z. Makki; David M. Binkley (DATE, 2002)

IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. - Ali Chehab; Rafic Z. Makki; Michael Spica; David Wu (DELTA, 2002)

Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing. - Scott Thomas; Rafic Z. Makki; Sai Kishore Vavilala (DELTA, 2004)

Scaling of iDDT Test Methods for Random Logic Circuits. - Ali Chehab; Saurabh Patel; Rafic Z. Makki (J. Electron. Test., 2006)

On Wires Holding a Handful of Electrons. - Valeriu Beiu; Walid Ibrahim; Rafic Z. Makki (NanoNet, 2009)

Nurturing the Growth of a National Infrastructure in Emerging Technologies. - Rafic Z. Makki; Victor V. Zhirnov; Ralph K. Cavin III; Sami Issa; Marco Iansiti (Proc. IEEE, 2018)