Advanced Mems for High Power Integrated Distribution Systems. - Rahim Kasim; Bruce C. Kim; Josef Drobnik (ICMENS, 2005)

Back End Of Line opportunities and reliability challenges for future technology nodes. - Mauro J. Kobrinsky; Rahim Kasim (IRPS, 2021)

Intrinsic Reliability of BEOL interlayer dielectric. - James Palmer 002; Galor Zhang; Justin R. Weber; Cheyun Lin; Christopher Perini; Rahim Kasim (IRPS, 2021)

Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced process nodes. - Rahim Kasim; Cheyun Lin; Christopher Perini; James Palmer 002; N. Gilda; S. Imam; Justin R. Weber; C. Wallace; Jeffery Hicks (IRPS, 2023)