Tunnelling Diode Technology. - Werner Prost; Uwe Auer; Franz-Josef Tegude; Christian Pacha; Karl Goser; Rainer Duschl; K. Eberl; O. Schmidt (ISMVL, 2001)

Is the power-law model applicable beyond the direct tunneling regime? - Rainer Duschl; Rolf-Peter Vollertsen (Microelectron. Reliab., 2005)

Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products. - Gerald Neumann; J. Touzel; Rainer Duschl (Microelectron. Reliab., 2005)

Reliability aspects of Hf-based capacitors: Breakdown and trapping effects. - Rainer Duschl; Martin Kerber; A. Avellan; S. Jakschik; Uwe Schroeder; S. Kudelka (Microelectron. Reliab., 2007)

Static and dynamic hot carrier accelerated TDDB: Influencing factors and impact on product lifetime. - Rainer Duschl; Armin H. Fischer; Achim Gratz; Robert Wiesner (Microelectron. Reliab., 2017)