Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures. - Stefan Holzer; Rainer Minixhofer; Clemens Heitzinger; Johannes Fellner; Tibor Grasser; Siegfried Selberherr (Microelectron. J., 2004)

FlexRay transceiver in a 0.35 µm CMOS high-voltage technology. - Federico Baronti; Paolo D'Abramo; Martin Knaipp; Rainer Minixhofer; Roberto Roncella; Roberto Saletti; Martin Schrems; Riccardo Serventi; Verena Vescoli (DATE Designers' Forum, 2006)

Analysis of hot carrier effects in a 0.35 µm high voltage n-channel LDMOS transistor. - Hubert Enichlmair; Sara Carniello; Jong Mun Park; Rainer Minixhofer (Microelectron. Reliab., 2007)

Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. - Robert Entner; Tibor Grasser; Oliver Triebl; Hubert Enichlmair; Rainer Minixhofer (Microelectron. Reliab., 2007)

Scalable High Voltage CMOS technology for Smart Power and sensor applications. - Martin Schrems; Martin Knaipp; Hubert Enichlmair; Verena Vescoli; Rainer Minixhofer; Ehrenfried Seebacher; Friedrich Peter Leisenberger; Ewald Wachmann; Gregor Schatzberger; Heimo Gensinger (Elektrotech. Informationstechnik, 2008)

Hot-carrier reliability in high-voltage lateral double-diffused MOS transistors. - Verena Vescoli; Jong Mun Park; Hubert Enichlmair; Martin Knaipp; Georg Röhrer; Rainer Minixhofer; Martin Schrems (IET Circuits Devices Syst., 2008)

Interface traps density-of-states as a vital component for hot-carrier degradation modeling. - Stanislav Tyaginov; Ivan A. Starkov; Oliver Triebl; Johann Cervenka; C. Jungemann; Sara Carniello; Jong Mun Park; Hubert Enichlmair; Markus Karner; Ch. Kernstock; Ehrenfried Seebacher; Rainer Minixhofer; et al. (Microelectron. Reliab., 2010)

Building interchangeable black-box models of integrated circuits for EMC simulations. - Marko Magerl; Christian Stockreiter; Oliver Eisenberger; Rainer Minixhofer; Adrijan Baric (EMC Compo, 2015)

Towards probabilistic analog behavioral modeling. - André Lange; Ihor Harasymiv; Oliver Eisenberger; Frederic Roger; Joachim Haase; Rainer Minixhofer (ISCAS, 2015)