Assignment and allocation of highly testable data paths under scan optimization. - Asad A. Ismaeel; Muhammad K. Dhodhi; Rajan Mathew (Integr., 1996)

Module allocation with idle-time utilization for on-line testability. - Asad A. Ismaeel; Rajan Mathew; R. Bhatnagar (Microelectron. Reliab., 2001)

On-line testable data path synthesis for minimizing testing time. - Asad A. Ismaeel; R. Bhatnagar; Rajan Mathew (Microelectron. Reliab., 2002)