Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps. - Rajat Butola; Yiming Li 005; Sekhar Reddy Kola (ISQED, 2022)

A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs. - Rajat Butola; Yiming Li 005; Sekhar Reddy Kola (IEEE Access, 2022)

Application of long short-term memory modeling technique to predict process variation effects of stacked gate-all-around Si nanosheet complementary-field effect transistors. - Rajat Butola; Yiming Li 005; Sekhar Reddy Kola; Chandni Akbar; Min-Hui Chuang (Comput. Electr. Eng., 2023)