A low power high speed envelope detector for serial data systems in 45nm CMOS. - Sumantra Seth; Rajavelu Thinakaran; Sujoy Chakravarty; Vikas Sinha (ISCAS, 2011)

Low cost dynamic error detection in linearity testing of SAR ADCs. - Nimit Jain; Nitin Agarwal; Rajavelu Thinakaran; Rubin A. Parekhji (ITC, 2017)

Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. - Li Xu; Yuming Zhuang; Rajavelu Thinakaran; Kenneth M. Butler; Degang Chen 001 (ITC, 2017)