Modeling spatial electrical properties in photovoltaic modules using PV-oriented nodal analysis. - Xiaofeng Wu; Martin Bliss; Tom Betts; Ralph Gottschalg; Archana Sinha; Rajesh Gupta 006 (IECON, 2013)

Cross-Characterization for Imaging Parasitic Resistive Losses in Thin-Film Photovoltaic Modules. - Archana Sinha; Martin Bliss; Xiaofeng Wu; Subinoy Roy; Ralph Gottschalg; Rajesh Gupta 006 (J. Imaging, 2016)