Backside E-Beam Probing on Nano scale devices. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Christian Boit; Rajesh Jain; Tahir Malik; Keneth R. Wilsher; Ted R. Lundquist; Bernd Krüger (ITC, 2007)

Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy. - Rudolf Schlangen; Uwe Kerst; Christian Boit; Tahir Malik; Rajesh Jain; Ted R. Lundquist (Microelectron. Reliab., 2007)

Pest Management In Cotton Farms: An AI-System Case Study from the Global South. - Aman Dalmia; Jerome White; Ankit Chaurasia; Vishal Agarwal; Rajesh Jain; Dhruvin Vora; Balasaheb Dhame; Raghu Dharmaraju; Rahul Panicker (KDD, 2020)