Fast Simulation Technique for LDPC Code Analysis. - Rajeshwary Tayade; Gwan Choi (International Conference on Wireless Networks, 2004)

Estimating path delay distribution considering coupling noise. - Rajeshwary Tayade; Vijay Kiran Kalyanam; Sani R. Nassif; Michael Orshansky; Jacob A. Abraham (ACM Great Lakes Symposium on VLSI, 2007)

Small-Delay Defect Detection in the Presence of Process Variations. - Rajeshwary Tayade; Savithri Sundareswaran; Jacob A. Abraham (ISQED, 2007)

Analytical model for the impact of multiple input switching noise on timing. - Rajeshwary Tayade; Sani R. Nassif; Jacob A. Abraham (ASP-DAC, 2008)

On-chip Programmable Capture for Accurate Path Delay Test and Characterization. - Rajeshwary Tayade; Jacob A. Abraham (ITC, 2008)

Small-delay defect detection in the presence of process variations. - Rajeshwary Tayade; Jacob A. Abraham (Microelectron. J., 2008)

Critical Path Selection for Delay Test Considering Coupling Noise. - Rajeshwary Tayade; Jacob A. Abraham (ETS, 2009)

Critical Path Selection for Delay Testing Considering Coupling Noise. - Rajeshwary Tayade; Jacob A. Abraham (J. Electron. Test., 2009)