Experiences with parametric BIST for production testing PLLs with picosecond precision. - Rakesh Kinger; Swetha Narasimhawsamy; Stephen K. Sunter (ITC, 2010)

Solving critical issues in 10nm technology using innovative laser-based fault isolation and DFT diagnosis techniques. - Lesly Endrinal; Rakesh Kinger; Lavakumar Ranganathan; Amit Sheth 001 (IRPS, 2018)