Experiences with Implementation of IDDQ Test for Identification and Automotive Products. - Ralf Arnold; Markus Feuser; Horst-Udo Wedekind; Thorsten Bode (ITC, 1997)

Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. - Frank Poehl; Matthias Beck; Ralf Arnold; Peter Muhmenthaler; Nagesh Tamarapalli; Mark Kassab; Nilanjan Mukherjee 001; Janusz Rajski (ITC, 2003)

Evaluating ATE-equipment for volume diagnosis. - Ralf Arnold; Andreas Leininger (ITC, 2005)

On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. - Frank Poehl; Jan Rzeha; Matthias Beck; Michael Gössel; Ralf Arnold; Peter Ossimitz (ETS, 2006)

On-chip evaluation, compensation and storage of scan diagnosis data. - Frank Poehl; Matthias Beck; Ralf Arnold; Jan Rzeha; Thomas Rabenalt; Michael Gössel (IET Comput. Digit. Tech., 2007)

Deterministic IDDQ diagnosis using a net activation based model. - Andras Kun; Ralf Arnold; Peter Heinrich; Gwenolé Maugard; Huaxing Tang; Wu-Tung Cheng (ITC, 2011)

Cell-aware experiences in a high-quality automotive test suite. - Friedrich Hapke; Ralf Arnold; Matthias Beck; M. Baby; S. Straehle; J. F. Goncalves; A. Panait; R. Behr; Gwenolé Maugard; A. Prashanthi; Juergen Schloeffel; Wilfried Redemund; et al. (ETS, 2014)

A Tutorial of How to Ensure High Automotive Microcontroller Quality. - Ralf Arnold (ETS, 2021)