Employing Scaled Sigma Sampling for Efficient Estimation of Rare Event Probabilities in the Absence of Input Domain Mapping. - Srinivas Jallepalli; Ram Mooraka; Sanjay Parihar; Earl Hunter; Elie Maalouf (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Rapid Assessment of Design Sensitivity to Process Excursions via Scaled Sigma Sampling. - Srinivas Jallepalli; Ram Mooraka; Sanjay Parihar; Earl Hunter; Elie Maalouf (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)