Characterising gate dielectrics in high mobility devices using novel nanoscale techniques. - Raman Kapoor; Enrique Escobedo-Cousin; S. H. Olsen; Steve J. Bull (Microelectron. Reliab., 2010)

Improved method for analyzing electrical data obtained from EEG for better diagnosis of brain related disorders. - Anil Kumar Dubey; Mala Saraswat; Raman Kapoor; Shaweta Khanna (Multim. Tools Appl., 2022)