Delay fault testing and silicon debug using scan chains. - Ramyanshu Datta; Antony Sebastine; Jacob A. Abraham (ETS, 2004)

On-chip delay measurement for silicon debug. - Ramyanshu Datta; Antony Sebastine; Ashwin Raghunathan; Jacob A. Abraham (ACM Great Lakes Symposium on VLSI, 2004)

A low latency and low power dynamic Carry Save Adder. - Ramyanshu Datta; Jacob A. Abraham; Robert K. Montoye; Wendy Belluomini; Hung C. Ngo; Chandler McDowell; Jente B. Kuang; Kevin J. Nowka (ISCAS (2), 2004)

Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing. - Ramyanshu Datta; Ravi Gupta; Antony Sebastine; Jacob A. Abraham; Manuel A. d'Abreu (ITC, 2004)

Testing and debugging delay faults in dynamic circuits. - Ramyanshu Datta; Sani R. Nassif; Robert K. Montoye; Jacob A. Abraham (ITC, 2005)

Adaptive Design for Performance-Optimized Robustness. - Ramyanshu Datta; Jacob A. Abraham; Abdulkadir Utku Diril; Abhijit Chatterjee; Kevin J. Nowka (DFT, 2006)

A Scheme for On-Chip Timing Characterization. - Ramyanshu Datta; Gary D. Carpenter; Kevin J. Nowka; Jacob A. Abraham (VTS, 2006)

Path-RO: a novel on-chip critical path delay measurement under process variations. - Xiaoxiao Wang 001; Mohammad Tehranipoor; Ramyanshu Datta (ICCAD, 2008)

Performance-Optimized Design for Parametric Reliability. - Ramyanshu Datta; Jacob A. Abraham; Abdulkadir Utku Diril; Abhijit Chatterjee; Kevin J. Nowka (J. Electron. Test., 2008)

Controllability of Static CMOS Circuits for Timing Characterization. - Ramyanshu Datta; Ravi Gupta; Antony Sebastine; Jacob A. Abraham; Manuel A. d'Abreu (J. Electron. Test., 2008)

A novel architecture for on-chip path delay measurement. - Xiaoxiao Wang 001; Mohammad Tehranipoor; Ramyanshu Datta (ITC, 2009)

Case studies of mixed-signal DFT. - Ramyanshu Datta; Mahit Warhadpande; Dale Heaton; S. Aarthi; Ram Jonnavithula (ISQED, 2010)

On-Chip Delay Measurement Based Response Analysis for Timing Characterization. - Ramyanshu Datta; Antony Sebastine; Ashwin Raghunathan; Gary D. Carpenter; Kevin J. Nowka; Jacob A. Abraham (J. Electron. Test., 2010)