Online Evaluation of Fretting Wear Aging Status of Press-Pack IGBT Device. - Huachen Hou; Ran Yao; Hui Li; Bailin Zhou; Zeyu Duan; Zhongyuan Chen; Jinyuan Li; MiaoRui Wang (iSPEC, 2023)

Fretting Wear Failure Modeling of Press-Pack IGBT Device based on Digital Twin Method. - Yuqi Wang; Ran Yao; Hui Li; Bailing Zhou; Zeyu Duan; Zhongyuan Chen; Jinyuan Li; MiaoRui Wang (iSPEC, 2023)

Model Construction and Empirical Study on Unsustainable Usage Behavior of Paid Knowledge Users. - Junping Qiu; Kaiyang Wei; Ran Yao (IEEE Access, 2023)

Time-Varying Cumulative Damage Recursive Method for Power Semiconductor Devices. - Wei Lai; Hanrui Li; Hui Li; Minyou Chen; Ran Yao; Hongjian Xia; Renkuai Liu; Anbin Liu (IEEE Trans. Ind. Electron., 2023)

Visualizations of scalar concentration fields of short cylindrical-hole-jets under oscillating mainstream conditions. - Wen-hao Guo; Jian Pu; Jianhua Wang; Ran Yao (J. Vis., 2025)