Scanning tunneling microscopy of cleaved semiconductor surfaces. - Randall M. Feenstra; A. P. Fein (IBM J. Res. Dev., 1986)

Application of electron and ion beam analysis techniques to microelectronics. - Tung-Sheng Kuan; Philip E. Batson; Randall M. Feenstra; Alan J. Slavin; Ruud M. Tromp (IBM J. Res. Dev., 1992)

Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures. - Martin A. Lutz; Randall M. Feenstra; Jack O. Chu (IBM J. Res. Dev., 1995)

Engineering p-n junctions in grapbene/molybdenum disulfide heterostructures. - Shruti Subramania; Ke Xu; Simon K. Moser; Donna Deng; Jun Li; Randall M. Feenstra; Susan K. Fullerton-Shirey; Joshua A. Robinson (DRC, 2019)