Cryogenic current comparator measurements at 77 K using thallium-2223 thick-film shields. - Randolph E. Elmquist (IEEE Trans. Instrum. Meas., 1999)

Calculable coaxial resistors for precision measurements. - Randolph E. Elmquist (IEEE Trans. Instrum. Meas., 2000)

Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory. - Randolph E. Elmquist; Anne-Marie Jeffery; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2001)

Transport behavior of commercially available 100-Ω standard resistors. - Bernd Schumacher; Peter Warnecke; Wilfrid Poirier; I. Delgado; Z. Msimang; Giorgio Boella; Per-Otto Hetland; Randolph E. Elmquist; Jonathan M. Williams; David Inglis; Beat Jeckelmann; Ove Gunnarsson; et al. (IEEE Trans. Instrum. Meas., 2001)

Using a high-value resistor in triangle comparisons of electrical standards. - Randolph E. Elmquist; Neil M. Zimmerman; William H. Huber (IEEE Trans. Instrum. Meas., 2003)

Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator. - Randolph E. Elmquist; Emmanouel Hourdakis; Dean G. Jarrett; Neil M. Zimmerman (IEEE Trans. Instrum. Meas., 2005)

Uncertainty Evaluation in a Two-Terminal Cryogenic Current Comparator. - M. E. Bierzychudek; Randolph E. Elmquist (IEEE Trans. Instrum. Meas., 2009)

SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ. - Dean G. Jarrett; Randolph E. Elmquist; Nien Fan Zhang; Alejandra Tonina; Marta Porfiri; Janice de Brito Fernandes; Helio Schechter; Daniel Izquierdo 003; Carlos Faverio; Daniel Slomovitz; David Inglis; Kai Wendler; et al. (IEEE Trans. Instrum. Meas., 2009)

Graphene Epitaxial Growth on SiC(0001) for Resistance Standards. - Mariano A. Real; Eric A. Lass; Fan-Hung Liu; Tian Shen; George R. Jones; Johannes A. Soons; David B. Newell; Albert V. Davydov; Randolph E. Elmquist (IEEE Trans. Instrum. Meas., 2013)

Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior. - Gert Rietveld; Jan H. N. van der Beek; Marlin Kraft; Randolph E. Elmquist; Alessandro Mortara; Beat Jeckelmann (IEEE Trans. Instrum. Meas., 2013)

Controlling the Fermi Level in a Single-Layer Graphene QHE Device for Resistance Standard. - Yasuhiro Fukuyama; Randolph E. Elmquist; Lung-I Huang; Yanfei Yang; Fan-Hung Liu; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study. - Nobu-hisa Kaneko; Takehiko Oe; Wan-Seop Kim; Dong-Hun Chae; Randolph E. Elmquist; Marlin Kraft (IEEE Trans. Instrum. Meas., 2015)

The units for mass, voltage, resistance, and electrical current in the SI. - Stephan Schlamminger; Patrick Abbott; Zeina Kubarych; Dean G. Jarrett; Randolph E. Elmquist (IEEE Instrum. Meas. Mag., 2019)

Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards. - Albert F. Rigosi; Alireza R. Panna; Shamith U. Payagala; Mattias Kruskopf; Marlin Kraft; George R. Jones; Bi-Yi Wu; Hsin-Yen Lee; Yanfei Yang; Jiuning Hu; Dean G. Jarrett; David B. Newell; et al. (IEEE Trans. Instrum. Meas., 2019)

Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. - Takehiko Oe; Albert F. Rigosi; Mattias Kruskopf; Bi-Yi Wu; Hsin-Yen Lee; Yanfei Yang; Randolph E. Elmquist; Nobu-hisa Kaneko; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2020)

Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe. - Shamith U. Payagala; Albert F. Rigosi; Alireza R. Panna; Alessio Pollarolo; Mattias Kruskopf; Stephan Schlamminger; Dean G. Jarrett; Ryan Brown; Randolph E. Elmquist; Duane Brown; David B. Newell (IEEE Trans. Instrum. Meas., 2020)

Graphene-Based Star-Mesh Resistance Networks. - Dean G. Jarrett; Ching-Chen Yeh; Shamith U. Payagala; Alireza R. Panna; Yanfei Yang; Linli Meng; Swapnil M. Mhatre; Ngoc Thanh Mai Tran; Heather M. Hill; Dipanjan Saha; Randolph E. Elmquist; David B. Newell; et al. (IEEE Trans. Instrum. Meas., 2023)

Implementation of a 1 GΩ Star-Mesh Graphene Quantized Hall Array Resistance Standard Network for High Resistance Calibration. - Marta Musso; Wei-Chen Lin; Yanfei Yang; Ngoc Thanh Mai Tran; Alireza R. Panna; Cheng-Hsueh Yang; Randolph E. Elmquist; David B. Newell; Chi-Te Liang; Massimo Ortolano; Albert F. Rigosi; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2025)