The Next Step in Volume Scan Diagnosis: Standard Fail Data Format. - Andreas Leininger; Ajay Khoche; Martin Fischer 002; Nagesh Tamarapalli; Wu-Tung Cheng; Randy Klingenberg; Wu Yang (ATS, 2006)

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. - Xijiang Lin; Kun-Han Tsai; Chen Wang 014; Mark Kassab; Janusz Rajski; Takeo Kobayashi; Randy Klingenberg; Yasuo Sato; Shuji Hamada; Takashi Aikyo (ATS, 2006)

Diagnosis with Limited Failure Information. - Yu Huang 005; Wu-Tung Cheng; Nagesh Tamarapalli; Janusz Rajski; Randy Klingenberg; Will Hsu; Yuan-Shih Chen (ITC, 2006)

Scan Diagnosis and Its Successful Industrial Applications. - Wu Yang; Wu-Tung Cheng; Yu Huang 005; Martin Keim; Randy Klingenberg (ATS, 2007)

Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data. - Wu-Tung Cheng; Randy Klingenberg; Brady Benware; Wu Yang; Manish Sharma; Geir Eide; Yue Tian; Sudhakar M. Reddy; Yan Pan; Sherwin Fernandes; Atul Chittora (ATS, 2017)

Scan Chain Diagnosis Based on Unsupervised Machine Learning. - Yu Huang 005; Brady Benware; Randy Klingenberg; Huaxing Tang; Jayant Dsouza; Wu-Tung Cheng (ATS, 2017)