Autofocus in infrared microscopy. - Raphael Abele; Daniele Fronte; Pierre-Yvan Liardet; Jean-Marc Boï; Jean-Luc Damoiseaux; Djamal Merad (ETFA, 2018)

Efficient Integrated Circuits Characterization Through Computer Vision Assistance. - Raphael Abele; Jean-Luc Damoiseaux; Daniele Fronte; Pierre-Yvan Liardet; Jean-Marc Boï; Djamal Merad (ETFA, 2020)

Graph Matching Applied For Textured Pattern Recognition. - Raphael Abele; Jean-Luc Damoiseaux; Daniele Fronte; Pierre-Yvan Liardet; Jean-Marc Boï; Djamal Merad (ICIP, 2020)

Spatial Location in Integrated Circuits through Infrared Microscopy. - Raphael Abele; Jean-Luc Damoiseaux; Redouane El Moubtahij; Jean-Marc Boï; Daniele Fronte; Pierre-Yvan Liardet; Djamal Merad (Sensors, 2021)

Traitement d'images pour l'automatisation de caractérisation sécuritaire de circuits intégrés. (Image Processing to automate secured caracterisation of Integrated Circuits). - Raphael Abele (2021)