Coded-Aperture Computational Millimeter-Wave Image Classifier Using Convolutional Neural Network. - Rahul Sharma; Raphael Hussung; Andreas Keil; Fabian Friederich; Thomas Fromenteze; Mohsen Khalily; Bhabesh Deka; Vincent F. Fusco; Okan Yurduseven (IEEE Access, 2021)

Fast FMCW Terahertz Imaging for In-Process Defect Detection in Press Sleeves for the Paper Industry and Image Evaluation with a Machine Learning Approach. - Maris Bauer; Raphael Hussung; Carsten Matheis; Hermann Reichert; Peter Weichenberger; Jens Beck; Uwe Matuschczyk; Joachim Jonuscheit; Fabian Friederich (Sensors, 2021)