ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems. - Peter Domanski; Dirk Pflüger; Raphaël Latty; Jochen Rivoir (ICMLA, 2021)

Feature Selection Using Batch-Wise Attenuation and Feature Mask Normalization. - Yiwen Liao; Raphaël Latty; Bin Yang 009 (IJCNN, 2021)

Self-Learning Tuning for Post-Silicon Validation. - Peter Domanski; Dirk Pflüger; Jochen Rivoir; Raphaël Latty (CoRR, 2021)

Intelligent Methods for Test and Reliability. - Hussam Amrouch; Jens Anders; Steffen Becker 001; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; et al. (DATE, 2022)

Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information. - Yiwen Liao; Raphaël Latty; Paul R. Genssler; Hussam Amrouch; Bin Yang 009 (ITC, 2022)

Conditional Variable Selection for Intelligent Test. - Yiwen Liao; Tianjie Ge; Raphaël Latty; Bin Yang 009 (CoRR, 2022)

A Deep-Learning-Aided Pipeline for Efficient Post-Silicon Tuning. - Yiwen Liao; Bin Yang 009; Raphaël Latty; Jochen Rivoir (CoRR, 2022)

Deep Feature Selection Using a Novel Complementary Feature Mask. - Yiwen Liao; Jochen Rivoir; Raphaël Latty; Bin Yang 009 (CoRR, 2022)

Experts in the Loop: Conditional Variable Selection for Accelerating Post-Silicon Analysis Based on Deep Learning. - Yiwen Liao; Raphaël Latty; Bin Yang 009 (CoRR, 2022)

Learn to Tune: Robust Performance Tuning in Post-Silicon Validation. - Peter Domanski; Dirk Pflüger; Raphaël Latty (ETS, 2023)