LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs. - Mohammed Zine E. Brahmi; Jennifer Dworak; Martina Perkovic; Megan Appel; Saidapet Ramesh; Ravi J. N; Ramanath Dharmavarm; Arun Kumar Anjaneyareddy; Chen He (ITC, 2025)

'Shifting-left' Zero Defect Scan Test Development to Launch Automotive PPM-ready Products. - Ravi J. N; Stephen Traynor (ITC, 2025)