Built-in self-test for large embedded CMOS folded PLAs. - Ramaswami Dandapani; Ravi K. Gulati; Deepak K. Goel (ICCAD, 1988)

An efficient compaction algorithm for test vectors of microprocessors and microcontrollers. - Ravi K. Gulati; Deepak K. Goel (ICCAD, 1988)

QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults. - Weiwei Mao; Ravi K. Gulati; Deepak K. Goel; Michael D. Ciletti (ICCAD, 1990)

Bridging faults and their implication to PLAs. - V. Chandramouli; Ravi K. Gulati; Ramaswami Dandapani; Deepak K. Goel (ITC, 1990)

Detection of "Undetectable" Faults Using IDDQ Testing. - Ravi K. Gulati; Weiwei Mao; Deepak K. Goel (ITC, 1992)

Introduction. - Ravi K. Gulati; Charles F. Hawkins (J. Electron. Test., 1992)

Quietest: A methodology for selecting IDDQ test vectors. - Weiwei Mao; Ravi K. Gulati (J. Electron. Test., 1992)

IDDQ testing: A review. - Jerry M. Soden; Charles F. Hawkins; Ravi K. Gulati; Weiwei Mao (J. Electron. Test., 1992)

Structure and Metrology for a Single-wire Analog. - Yunsheng Lu; Weiwei Mao; Ramaswami Dandapani; Ravi K. Gulati (ITC, 1994)

Improving Gate Level Fault Coverage by RTL Fault Grading. - Weiwei Mao; Ravi K. Gulati (ITC, 1996)