Two New Metrics for Feature Selection in Pattern Recognition. - Pedro Y. Piñero; Leticia Arco; María M. García; Yaile Caballero; Raykenler Yzquierdo; Alfredo Morales (CIARP, 2003)

Sub-process Discovery: Opportunities for Process Diagnostics. - Raykenler Yzquierdo-Herrera; Rogelio Silverio-Castro; Manuel Lazo-Cortés (CONFENIS, 2012)