A Statistical Approach to the Design of Diffused Junction Transistors. - David P. Kennedy; Philip C. Murley; Redmond R. O'Brien (IBM J. Res. Dev., 1964)

Analysis of the Impurity Atom Distribution Near the Diffusion Mask for a Planar p-n Junction. - David P. Kennedy; Redmond R. O'Brien (IBM J. Res. Dev., 1965)

The Effective Carrier Ionization Rate in a p-n Junction at Avalanche Breakdown. - David P. Kennedy; Redmond R. O'Brien (IBM J. Res. Dev., 1965)