Digital Defect Oriented Test Method for Phase Locked Loops with High Coverage. - Michael Sekyere; Marampally Saikiran; Godfred Bonsu; Kelvin W. Tamakloe; Rob Butler; Reed Adams; Degang Chen 001 (I2MTC, 2025)

Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry. - Michael Sekyere; Marampally Saikiran; Rob Butler; Reed Adams; Degang Chen 001 (ISCAS, 2025)