A simple and effective compression scheme for test pins reduction. - Marie-Lise Flottes; Regis Poirier; Bruno Rouzeyre (HLDVT, 2002)

An Arithmetic Structure for Test Data Horizontal Compression. - Marie-Lise Flottes; Regis Poirier; Bruno Rouzeyre (DATE, 2004)

On Using Test Vector Differences for Reducing Test Pin Numbers. - Marie-Lise Flottes; Regis Poirier; Bruno Rouzeyre (DELTA, 2004)