Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs. - Mitsuya Fukazawa; Tetsuro Matsuno; Toshifumi Uemura; Rei Akiyama; Tetsuya Kagemoto; Hiroshi Makino; Hidehiro Takata; Makoto Nagata (ISSCC, 2007)

Phase-adjustable error detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for dynamic voltage scaling. - Masanori Kurimoto; Hiroaki Suzuki; Rei Akiyama; Tadao Yamanaka; Haruyuki Ohkuma; Hidehiro Takata; Hirofumi Shinohara (DAC, 2008)

Experimental Evaluation of Dynamic Power Supply Noise and Logical Failures in Microprocessor Operations. - Mitsuya Fukazawa; Masanori Kurimoto; Rei Akiyama; Hidehiro Takata; Makoto Nagata (IEICE Trans. Electron., 2009)

Phase-adjustable error detection flip-flops with 2-stage hold-driven optimization, slack-based grouping scheme and slack distribution control for dynamic voltage scaling. - Masanori Kurimoto; Hiroaki Suzuki; Rei Akiyama; Tadao Yamanaka; Haruyuki Ohkuma; Hidehiro Takata; Hirofumi Shinohara (ACM Trans. Design Autom. Electr. Syst., 2010)