Backside E-Beam Probing on Nano scale devices. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Christian Boit; Rajesh Jain; Tahir Malik; Keneth R. Wilsher; Ted R. Lundquist; Bernd Krüger (ITC, 2007)

Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Ted R. Lundquist; Peter Egger; Christian Boit (Microelectron. Reliab., 2009)

Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. - Sanjib Kumar Brahma; Arkadiusz Glowacki; Reiner Leihkauf; Christian Boit (Microelectron. Reliab., 2011)

Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources. - Carlo Pagano; Christian Boit; Arkadiusz Glowacki; Reiner Leihkauf; Yoshiyuki Yokoyama (Microelectron. Reliab., 2012)