Experience in HBM ESD testing of high pin count devices. - Tilo Brodbeck; Reinhold Gaertner (Microelectron. Reliab., 2007)

Do ESD fails in systems correlate with IC ESD robustness? - Wolfgang Stadler; Tilo Brodbeck; Reinhold Gärtner; Harald Gossner (Microelectron. Reliab., 2009)

Electrical Overstress of Integrated Circuits. - K. T. Kaschani; Reinhold Gärtner (Microelectron. Reliab., 2014)