An effective fault simulation method for core based LSI. - Takaki Yoshida; Reisuke Shimoda; Takashi Mizokawa; Katsuhiro Hirayama (Asian Test Symposium, 1997)

Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits. - Reisuke Shimoda; Takaki Yoshida; Masafumi Watari; Yasuhiro Toyota; Kiyokazu Nishi; Akira Motohara (Asian Test Symposium, 1999)

Defect Diagnosis - Reasoning Methodology. - Yasuo Sato; Kazushi Sugiura; Reisuke Shimoda; Yutaka Yoshizawa; Kenji Norimatsu; Masaru Sanada (ATS, 2006)