A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. - Guillaume Hubert; Nadine Buard; Cécile Weulersse; Thierry Carrière; Marie-Catherine Palau; Jean-Marie Palau; Damien Lambert; Jacques Baggio; Frederic Wrobel; Frédéric Saigné; Rémi Gaillard (IOLTS, 2005)

Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. - Guillaume Hubert; Antonin Bougerol; Florent Miller; Nadine Buard; Lorena Anghel; Thierry Carrière; Frederic Wrobel; Rémi Gaillard (IOLTS, 2006)

Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks? - Nadine Buard; Florent Miller; Cédric Ruby; Rémi Gaillard (IOLTS, 2007)

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. - Claudia Rusu; Antonin Bougerol; Lorena Anghel; Cécile Weulersse; Nadine Buard; S. Benhammadi; Nicolas Renaud; Guillaume Hubert; Frederic Wrobel; Thierry Carrière; Rémi Gaillard (IOLTS, 2007)

Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. - Damien Leroy; Rémi Gaillard; Erwin Schäfer; Cyrille Beltrando; Shi-Jie Wen; Richard Wong (IOLTS, 2008)

Test methodology of a new upset mechanism induced by protons in deep sub-micron devices. - Cécile Weulersse; Florent Miller; Dan Alexandrescu; Erwin Schaefer; Olivier Crépel; Rémi Gaillard (Microelectron. Reliab., 2012)