An accurate closed-expression model for FinFETs parasitic resistance. - A. S. N. Pereira; Renato C. Giacomini (Microelectron. Reliab., 2015)

Ionizing radiation effects on a COTS low-cost RISC microcontroller. - Felipe G. H. Leite; Roberto B. B. Santos; Nilberto H. Medina; Vitor A. P. Aguiar; Renato C. Giacomini; Nemitala Added; Fernando Aguirre; Eduardo L. A. Macchione; Fabian Vargas 001; Marcilei Aparecida Guazzelli da Silveira (LATS, 2017)

Fault-tolerant architecture with full recovery under presence of SEU. - Augusto Einsfeldt; Renato C. Giacomini (LATS, 2018)

Single event effect: Simulations and analysis on 3N163 PMOS transistor. - Juliano Oliveira; Marcilei Aparecida Guazzelli; Marco Antonio Assis; Renato C. Giacomini (LATS, 2018)

Filter-free color pixel sensor using gated PIN photodiodes and machine learning techniques. - João Batista Junior; Arianne Pereira; Rudolf Buhler; André Perin; Carla Novo; Milene Galeti; Juliano Oliveira; Renato C. Giacomini (Microelectron. J., 2022)

Exploring Fault Tolerance to Ionizing Radiation in Severe Environments: Power Transistors with Distinct Layouts. - Paulo R. Garcia; Guilherme I Grandesi; Alexis C. Vilas Bôas; Renato C. Giacomini; Nilberto H. Medina; Luis Eduardo Seixas Jr.; Marcilei Aparecida Guazzelli (LASCAS, 2025)