Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. - Renjian Pan; Zhaobo Zhang; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (VTS, 2019)

Unsupervised Root-Cause Analysis for Integrated Systems. - Renjian Pan; Zhaobo Zhang; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (ITC, 2020)

Fine-grained Adaptive Testing Based on Quality Prediction. - Mengyun Liu; Renjian Pan; Fangming Ye; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (ACM Trans. Design Autom. Electr. Syst., 2020)

Analog/RF Post-silicon Tuning via Bayesian Optimization. - Renjian Pan; Jun Tao 001; Yangfeng Su; Dian Zhou; Xuan Zeng 001; Xin Li 001 (ACM Trans. Design Autom. Electr. Syst., 2020)

Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems. - Renjian Pan; Xin Li 001; Krishnendu Chakrabarty (VTS, 2021)

Black-Box Test-Cost Reduction Based on Bayesian Network Models. - Renjian Pan; Zhaobo Zhang; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

Applying Machine Learning to Testing and Diagnosis of Integrated Systems. - Renjian Pan (2021)

Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems. - Renjian Pan; Xin Li 001; Krishnendu Chakrabarty (VTS, 2022)

Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems. - Renjian Pan; Zhaobo Zhang; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems. - Renjian Pan; Xin Li 001; Krishnendu Chakrabarty (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

Root-Cause Analysis with Semi-Supervised Co-Training for Integrated Systems. - Renjian Pan; Xin Li 001; Krishnendu Chakrabarty (ACM Trans. Design Autom. Electr. Syst., 2024)