Transmission line characterization for high frequency synchronization systems design. - Oscar González-Díaz; Mónico Linares Aranda; Reydezel Torres-Torres (CONIELECOMP, 2010)

Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs. - German A. Alvarez-Botero; Reydezel Torres-Torres; Roberto S. Murphy-Arteaga (Microelectron. Reliab., 2011)

Analysis of the effects of coupling through substrate and the calculus of the Q factor. - Emmanuel Torres-Rios; Svetlana Carsof Sejas Garcia; Luiz Carlos Moreira; Reydezel Torres-Torres; Wilhelmus A. M. Van Noije (LASCAS, 2013)

Novel PCB fabrication process roughness free for high frequency applications. - Abel Perez-Fajardo; Alfonso Torres-Jácome; Reydezel Torres-Torres (CCE, 2015)

Characterization of transmission lines in a novel high-frequency laminate. - Abel Perez-Fajardo; D. M. Cortes-Hernandez; Reydezel Torres-Torres; Alfonso Torres-Jácome (LASCAS, 2016)

A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. - Adelmo Ortiz-Conde; Andrea Sucre-González; Fabián Zárate-Rincón; Reydezel Torres-Torres; Roberto S. Murphy-Arteaga; Juin J. Liou; Francisco J. García-Sánchez (Microelectron. Reliab., 2017)

Semiempirical Model for IC Interconnects Considering the Coupling Between the Signal Trace and the Ground Plane. - Mónico Linares Aranda; Oscar González-Díaz; D. M. Cortes-Hernandez; Reydezel Torres-Torres (Circuits Syst. Signal Process., 2018)

Characterization and modeling of on-chip via stacks for RF-CMOS applications. - Carlos Alberto Sanabria Diaz; Mónico Linares Aranda; Reydezel Torres-Torres; Alejandro Díaz-Sánchez (IEICE Electron. Express, 2020)

Modeling Passive Devices for CMOS RF Circuits. - José Valdés; Reydezel Torres-Torres; Roberto S. Murphy (MIXDES, 2021)

Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. - Dora A. Chaparro-Ortiz; Alan Y. Otero-Carrascal; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Guevara; P. Srinivasan 002; Fernando Guarin (IRPS, 2023)

Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. - Alan Y. Otero-Carrascal; Dora A. Chaparro-Ortiz; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Gonzalez; P. Srinivasan 002 (IRPS, 2024)

Assessment of Performance of One-Turn Inductors in Series Configuration Through a Transmission-Line Modeling Approach. - German A. Alvarez-Botero; Eduardo Moctezuma-Pascual; Miguel A. G. Laso; Reydezel Torres-Torres (IEEE Access, 2024)

An Improved Method to Measure, Characterize, and Model Microstrip Antennas in the W Band. - Roberto S. Murphy-Arteaga; Edgar Colín-Beltrán; María T. Serrano-Serrano; Chudy Nwachukwu; Svetlana Carsof Sejas Garcia; Reydezel Torres-Torres (IEEE Instrum. Meas. Mag., 2024)

Off-State TDDB Degradation of RC-Features and Threshold Voltage on Advanced FinFETs from RF Measurements for 5G Applications. - Alan Y. Otero-Carrascal; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Gonzalez; P. Srinivasan 002; Héctor Uribe (IRPS, 2025)