Test plan methodology. - Reza Pazirandeh (ACM SIGSOFT Softw. Eng. Notes, 1986)

Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. - Arkadiusz Glowacki; Piotr Laskowski; Christian Boit; Ponky Ivo; Eldad Bahat-Treidel; Reza Pazirandeh; Richard Lossy; Joachim Würfl; Günther Tränkle (Microelectron. Reliab., 2009)

Determination of GaN HEMT reliability by monitoring IDSS. - Reza Pazirandeh; Joachim Würfl; Günther Tränkle (Microelectron. Reliab., 2010)