A novel fault detection approach based on multilinear sparse PCA: application onthe semiconductor manufacturing processes. - Riadh Toumi; Yahia Kourd; Dimitri Lefebvre (Turkish J. Electr. Eng. Comput. Sci., 2022)

Fault Diagnosis with Stacked Sparse AutoEncoder for Multimode Process Monitoring. - Yahia Kourd; Messaoud Ramdani; Riadh Toumi; Ahmed Samet (ICINCO (1), 2023)