Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric. - Nicola Wrachien; Andrea Cester; Daniele Bari; Raffaella Capelli; Riccardo D'Alpaos; Michele Muccini; Andrea Stefani; Guido Turatti; Gaudenzio Meneghesso (Microelectron. Reliab., 2013)

Effects of constant voltage stress on organic complementary logic inverters. - Nicola Wrachien; Andrea Cester; Nicolò Lago; Gaudenzio Meneghesso; Riccardo D'Alpaos; Andrea Stefani; Guido Turatti; Michele Muccini (ESSDERC, 2014)

Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states. - Nicola Wrachien; Andrea Cester; Nicolò Lago; Gaudenzio Meneghesso; Riccardo D'Alpaos; Andrea Stefani; Guido Turatti; Michele Muccini (Microelectron. Reliab., 2014)

Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. - Nicola Wrachien; Nicolò Lago; Antonio Rizzo; Riccardo D'Alpaos; Andrea Stefani; Guido Turatti; Michele Muccini; Gaudenzio Meneghesso; Andrea Cester (Microelectron. Reliab., 2015)