Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. - Andrea Natale Tallarico; Susanna Reggiani; Paolo Magnone; Giuseppe Croce; Riccardo Depetro; P. Gattari; Enrico Sangiorgi; Claudio Fiegna (Microelectron. Reliab., 2017)

TCAD investigation on hot-electron injection in new-generation technologies. - Susanna Reggiani; Mattia Rossetti; Antonio Gnudi; Andrea Natale Tallarico; Antonio Molfese; Stefano Manzini; Riccardo Depetro; Giuseppe Croce; Enrico Sangiorgi; Claudio Fiegna (Microelectron. Reliab., 2018)

TCAD predictions of hot-electron injection in p-type LDMOS transistors. - Federico Giuliano; Riccardo Depetro; Giuseppe Croce; Andrea Natale Tallarico; Susanna Reggiani; Antonio Gnudi; Enrico Sangiorgi; Claudio Fiegna; Mattia Rossetti; Antonio Molfese; Stefano Manzini (ESSDERC, 2019)

Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors. - Andrea Natale Tallarico; Susanna Reggiani; Riccardo Depetro; Giuseppe Croce; Enrico Sangiorgi; Claudio Fiegna (IRPS, 2020)