Read disturb on flash memories: Study on temperature annealing effect. - Luca Cola; M. De Tomasi; Riccardo Enrici Vaion; A. Mervic; P. Zabberoni (Microelectron. Reliab., 2012)

Metal fatigue in copper pillar Flip Chip BGA: A refined acceleration model for the aluminium pad cracking failure mechanism. - R. Alberti; Riccardo Enrici Vaion; A. Mervic; S. Testa (Microelectron. Reliab., 2015)

Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. - Riccardo Enrici Vaion; Matteo Medda; Alberto Mancaleoni; Giovanna Mura; A. Pintus; M. De Tomasi (Microelectron. Reliab., 2017)