Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM. - Devanarayanan Ettisserry; Angelo Visconti; Mauro Bonanomi; Riccardo Pazzocco; Andrea Locatelli; Alessandro Sebastiani; Ashonita Chavan; Matthew Hollander; Giorgio Servalli; Alessandro Calderoni; Nirmal Ramaswamy (IRPS, 2024)